HOME > Presentation > DetailDevelopment of compact multiple-probe AFM/KFM for nanoscale electrical measurement in various environment新ヶ谷 義隆, 繆 滌 霏, 徐 建勛, クリーシー リアノン, 青野 正和, 中山 知信. FON14. November 26, 2014-November 28, 2014.NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:32:29 +0900 Updated at: 2017-07-10 22:03:03 +0900