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(Nanoscale resistance variation in a single nanowire measured by double-scanning-probe tunneling microscope)
4th International Symposium on Surface Science and Nanotechnolog. November 14, 2005-November 17, 2005.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:25:28 +0900 Updated at: 2017-07-10 19:29:26 +0900