HOME > Presentation > Detail
Nanofabrication with intense and focused electron beam and ultra-high vacuum Cs corrected STEM
JEOL High-End Transmission Electron Microscopy Seminar. 2008-06-17. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:57:57 +0900 Updated at: 2024-03-05 11:41:56 +0900