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LSCO 固有ジョセフソン接合における脱出確率の接合数依存性
(Stacking Layer Number Dependence of Escape Rate in Intrinsic Josephson Junctions of La2-xSrxCuO4)
日本物理学会2008年秋季大会. September 20, 2008-September 23, 2008.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:51:31 +0900 Updated at: 2017-07-10 20:19:00 +0900