HOME > Presentation > Detail(HTS SQUID Probe Microscope for Cooled HTS Sample)林 忠之, 立木 実, 何 東風, 渡邉 騎通, 糸崎 秀夫. International Superconductive Electronics Conference 2009 . June 16, 2009-June 19, 2009.NIMS author(s)TACHIKI, MinoruHE, DongfengFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:15:09 +0900 Updated at: 2017-07-10 20:31:39 +0900