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AuthorBin Han, Yasuo Shimizu, JEVASUWAN, Wipakorn, NISHIBE, Kotaro, Kouji Inoue, FUKATA, Naoki, Yasuyoshi Nagai.
Titleアトムプローブ法によるGe/Siコアシェルナノワイヤ中の不純物分布
(Characterization of dopant in Individual Si / Ge Core-Shell Nanowires Investigated by Atom Probe Tomography)
Event name春季第63回応用物理学関係連合講演会
Year of publication2016
LanguageJapanese
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