Cathodoluminescence study of 3C-SiC layer grown on 4H-SiC substrate

HOME > 口頭発表 > 書誌詳細

CHEN, Jun, Hiroyuki Sazawa, Wei YI, Takashi SEKIGUCHI.

DRIP XIX (19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors). 2022.

作成時刻: 2023-01-17 03:33:57 +0900更新時刻: 2023-01-17 03:33:57 +0900