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Establishment of thickness-controlled TEM lamella preparation method with minimized FIB-induced damage using FIB-SEM
The 21st International Microscopy Congress 2026 (IMC21). August 31, 2026-September 04, 2026.
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Created at: 2026-09-05 03:06:29 +0900 Updated at: 2026-09-05 03:06:29 +0900