HOME > 口頭発表 > 書誌詳細Investigation on the trap states at p-GaN MO(I)S interface with different gate dielectric layersSANG, Liwen. 2018 MRS Fall Meeting & Exhibit. 2018.NIMS著者サン リウエンMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-04 09:35:53 +0900更新時刻: 2019-03-04 09:35:53 +0900
