HOME > Presentation > DetailInvestigation on the trap states at p-GaN MO(I)S interface with different gate dielectric layersSANG, Liwen. 2018 MRS Fall Meeting & Exhibit. 2018.NIMS author(s)SANG, LiwenFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-04 09:35:53 +0900Updated at: 2019-03-04 09:35:53 +0900