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GaNトランジスタのオペランド顕微分光観測
(Quantification of Surface Electron Trapping of GaN Transistors by Using Operando Soft X-ray Photoelectron Nanospectroscopy)

吹留博一, 大美賀圭一, 舘野泰範, 河内剛志, 駒谷務, 永村 直佳, 今野隼, 高橋良暢, 小嗣真人, 堀場弘司, 末光眞紀, 尾嶋正治.
The 8th International Symposium on Surface Science. October 22, 2017-October 26, 2017.

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    Created at: 2017-10-17 22:16:58 +0900Updated at: 2018-06-05 14:14:06 +0900

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