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蛍光顕微鏡と2次イオン質量分析を用いたGaInN薄膜の不均一評価
(Characterization of heterogeneity on GaInN films by fluorescence microscope and secondary ion mass spectrometry)
2014年第61回応用物理学会春季学術講演会. 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:49:13 +0900Updated at: 2018-06-05 13:43:19 +0900