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X-ray absorption microspectroscopy with electrostatic force microscopy and its application to chemical states analyses of Si oxide nano structures
(静電気力顕微鏡を使ったX線吸収顕微分光とその酸化Siナノ構造の化学状態分析への応用)
XAFS13. July 09, 2006-July 14, 2006.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 11:53:59 +0900Updated at: 2022-09-05 11:53:59 +0900