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Plasmon-induced Charge Transport at Transition Metal Nitride-Semiconductor Interfaces via In Situ Nanoimaging
CLEO: Conference on Lasers and Electro-Optics. May 09, 2021-May 14, 2021.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-01-27 15:59:24 +0900 Updated at: 2022-01-27 15:59:24 +0900