Plasmon-induced Charge Transport at Transition Metal Nitride-Semiconductor Interfaces via In Situ Nanoimaging
CLEO: Conference on Lasers and Electro-Optics. 2021.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-01-27 15:59:24 +0900更新時刻: 2022-01-27 15:59:24 +0900