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Si(111)-4X1-In表面超構造の電気伝導測定
(ELECTRON TRANSPORT THROUGH THE Si(111)-4X1-In SURFACE RECONSTRUCTION)
7th International Conference on Nanometer-scale Science and Tech. June 24, 2002-June 28, 2002.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:08:08 +0900 Updated at: 2017-07-10 18:24:34 +0900