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Analytical STEM applying a superconductor Transition Edge Sensor type Microcalorimeter EDS for X-ray Nanoanalysis.
The 19th International Microscopy Congress (IMC19). September 09, 2018-September 14, 2018.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-03-03 22:32:40 +0900Updated at: 2018-06-05 14:18:46 +0900