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Analytical STEM applying a superconductor Transition Edge Sensor type Microcalorimeter EDS for X-ray Nanoanalysis.

原 徹, 田中啓一, 前畑京介, 満田和久, 山中良浩, 日高睦夫, 中村邦康.
The 19th International Microscopy Congress (IMC19). September 09, 2018-September 14, 2018.

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    Created at: 2018-03-03 22:32:40 +0900Updated at: 2018-06-05 14:18:46 +0900

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