HOME > 口頭発表 > 書誌詳細(Band Gap States in AlGaN/GaN Hetero-Interface Studied by Deep-Level Optical Spectroscopy)中野由崇, 中村圭二, 色川 芳宏, 竹口 雅樹. 13th International Conference on Defects - Recognition, Imaging. 2009.NIMS著者色川 芳宏竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:24:41 +0900更新時刻: 2018-06-05 12:37:15 +0900