HOME > Presentation > Detail(Electric conductivity measurement of nanowires by multi-probe scanning tunneling microscope)久保 理, 新ヶ谷 義隆, 中山 知信, 青野 正和. 日英ナノテクノロジーシンポジウム. 2005-03-09. InvitedNIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:34:08 +0900 Updated at: 2024-03-05 11:40:35 +0900