Probing graphene nanomesh fidelity by electrical transport measurement
Marek Edward Schmidt, Marek Edward Schmidt, Mayeesha Haque, IWASAKI, Takuya, Shinichi Ogawa, Hiroshi Mizuta, Manoharan Muruganathan, Ngoc Huynh Van, Manoharan Muruganathan, Mayeesha Haque, Ngoc Huynh Van, 小川真一, 水田博.
