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X線回折における異常散乱現象を用いたZnO薄膜の極性判定
(Polarity determination of ZnO films by x-ray diffraction using anomalous dispersion)
MRS 2009 Fall Meeting. November 30, 2009-December 04, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:09:35 +0900 Updated at: 2017-07-10 20:34:13 +0900