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Electrical Characteristics and Stability of HfO2/GaSb MOS Interfaces Formed on Clean GaSb(100)-c(2×6) Surfaces
2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE. November 07, 2013-November 09, 2013.
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Created at: 2017-01-08 04:42:43 +0900 Updated at: 2017-07-10 21:42:46 +0900