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Electrical Characteristics and Stability of HfO2/GaSb MOS Interfaces Formed on Clean GaSb(100)-c(2×6) Surfaces
2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE. 2013.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:42:43 +0900Updated at: 2017-07-10 21:42:46 +0900