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(Helium depth profile of low energy 4He implanted samples)
SISS-16. June 19, 2014-June 20, 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:54:22 +0900Updated at: 2017-07-10 21:56:20 +0900