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放射光硬X線光電子分光を用いたITO/p-GaN界面の解析及びその電気特性
(Analysis of ITO/p-GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopy and their electrical characteristics)
秋季第68回応用物理学会. September 04, 2007-September 08, 2007.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:51:18 +0900Updated at: 2017-07-10 19:57:37 +0900