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Si基板上に直接成長させたGe膜のRBS測定
(RBS analysis of the Ge layer directly grown on Si substrate)
16th International Conference on Ion Beam Modification of Materi. August 31, 2008-September 05, 2008.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:05:02 +0900Updated at: 2017-07-10 20:14:40 +0900