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Scanning transmission electron microscope -transition edge sensor (STEM-TES)
11th Asia-Pacific Microscopy Conference(APMC11). May 23, 2016-May 27, 2016.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:41:10 +0900 Updated at: 2017-07-10 22:25:45 +0900