HOME > Presentation > Detailシリコンおよびゲルマニウムナノワイヤ中への不純物ドーピングと評価(Doping and characterization of impurity atoms in Si and Ge nanowires)深田 直樹. 2012 RCIQE International Workshop for Green Electronics. March 05, 2012-March 06, 2012. InvitedNIMS author(s)FUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:24:56 +0900 Updated at: 2024-03-05 11:43:55 +0900