HOME > 口頭発表 > 書誌詳細(Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus images)木本 浩司, 石塚 和夫. 18th International Microscopy Congress. 2014.NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-01-08 04:13:08 +0900更新時刻: 2017-07-10 21:53:25 +0900