HOME > Presentation > Detail(Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus images)木本 浩司, 石塚 和夫. 18th International Microscopy Congress. September 07, 2014-September 12, 2014.NIMS author(s)KIMOTO, KojiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:13:08 +0900 Updated at: 2017-07-10 21:53:25 +0900