HOME > 口頭発表 > 書誌詳細Energy distribution of interface states at SiO2/4H-SiC(0001) obtained from operando photoelectron spectroscopyYAMASHITA, Yoshiyuki. International Conference on Nanoelectronics Strategy. 2018.NIMS著者山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻 :2019-03-04 10:09:02 +0900 更新時刻 :2019-03-04 10:09:02 +0900