HOME > 口頭発表 > 書誌詳細Three-Dimensional Analysis of Nanoparticles using Annular Dark-Field Scanning Confocal Electron Microscopy Established in a DoubHASHIMOTO, Ayako. The 2nd International Symposium on Advanced Microscopy and Theor. 2010.NIMS著者橋本 綾子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 12:51:15 +0900更新時刻: 2022-09-05 12:51:15 +0900