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Imaging holes in organic transistors by operando photoemission electron microscopy
The 15th International Conference on Optical Probes of Organic and Hybrid Semiconductors (OP 2025). September 21, 2025-September 26, 2025.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-10-22 03:10:37 +0900 Updated at: 2025-10-22 03:10:37 +0900