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Application of Transition Edge Sensor as an X-ray spectrometer for Scanning Transmission Electron Microscope
The 29th International Superconductivity Symposium (ISS2016) . December 13, 2016-December 15, 2016. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:57:08 +0900 Updated at: 2024-03-05 11:46:35 +0900