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共鳴軟 X 線回折による薄膜試料の電子状態観測
(Electronic State of Thin Films as Seen via Resonant Soft X-ray Diffraction)
応用物理学会秋季学術講演会. 2017. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-07-11 22:39:17 +0900Updated at: 2024-03-05 12:20:08 +0900