HOME > Presentation > Detail
スペクトル分離法による異種物質界面の深さ方向分析.
(Depth Profile Analysis on Interfaces with Spectral Resolving Technique.)
日本金属学会. October 01, 1991-October 03, 1991.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:22:48 +0900 Updated at: 2017-07-10 17:12:08 +0900