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Hard X-ray Photoelectron Spectroscopic Study on High-k Dielectrics Based Resistive random access memory
PRiME 2016/230th ECS Meeting. October 02, 2016-October 07, 2016. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-10-22 02:44:23 +0900 Updated at: 2024-03-05 11:46:28 +0900