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Probe-EBIC法によるSi(111)基板上BaSi2薄膜の接合・結晶粒評価
(Characterization of junctions and grains in BaSi2 thin film grown on Si(111) substrate by probe-EBIC technique)
2013年春季<第60回>応用物理学会. 2013.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:20:47 +0900Updated at: 2018-06-05 13:18:13 +0900