HOME > Presentation > DetailNon Destructive Evaluation Using High-Tc SQUID for Detecting Defects below a Metal Layer何 東風, 立木 実, 糸崎 秀夫. 21st International Symposium on Superconductivity (ISS2008). October 27, 2008-October 29, 2008.NIMS author(s)HE, DongfengTACHIKI, MinoruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:00:32 +0900Updated at: 2017-07-10 20:21:20 +0900