HOME > Presentation > Detail窒素をδドープしたGaPにおける単一等電子トラップの高分解能発光測定(High-resolution Luminescence Measurement of Single Isoelectronic Traps in Nitrogen δ-doped GaP)池沢道男, 佐久間 芳樹, 渡邉真人, 舛本泰章. 第55回応用物理学関係連合講演会. March 27, 2008-March 30, 2008.NIMS author(s)SAKUMA, YoshikiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:43:11 +0900 Updated at: 2017-07-10 20:10:45 +0900