HOME > Presentation > DetailSPring-8硬X線光電子分光によるメモリーデバイスの埋もれた界面化学反応の解明(Investigation of chemical reaction at “buried” interface of memory device by hard X-ray photoelectron spectroscopy at SPring-8)中尾愛子, 石井 真史, 孫 珍永, 町田雅武, 渡辺義夫. 第69回応用物理学会学術講演会. September 02, 2008-September 05, 2008.NIMS author(s)ISHII, MasashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:16:29 +0900Updated at: 2017-07-10 20:21:25 +0900