走査SQUID顕微鏡による薄膜中の欠陥、電流、量子化磁束の同時評価
(Simultaneous Characterization of Defects, Quantized Magnetic Flux and Current Flows in Oxide Superconducting Thin Films. )
E-MRS 2013 Spring Meeting. 2013.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 05:04:18 +0900更新時刻: 2017-07-10 21:32:38 +0900