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2探針STMによる電気測定:単一およびバンドルした単層CNTの比較
(Electrical measurements by double-scanning-probe tunneling microscope: Isolated and bundled single-wall CNTs)
第53回応用物理学関係連合講演会. March 22, 2006-March 26, 2006.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:37:10 +0900 Updated at: 2018-05-30 19:42:24 +0900