HOME > Presentation > Detail原子層数で決まる離散的な高さ分布を持つディスク状InAs量子ドットの発光寿命測定(PL Lifetime Measurements in InAs Quantum Disks with Thickness of Several Atomic Layers)冨本慎一, 黒川篤, 佐久間 芳樹, 臼杵達哉, 舛本泰章. 第67回応用物理学学術講演会. August 29, 2006-September 01, 2006.NIMS author(s)SAKUMA, YoshikiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:31:38 +0900Updated at: 2017-07-10 19:42:15 +0900