HOME > Presentation > Detail(Low Temperature Scanning Tunneling Microscopy on a p-type Si(100) Surface)鷺坂 恵介, 北原 昌代, 藤田 大介, 木戸 義勇, 小口 信行. The 9th International Symposium on Advanced Physical Fields (APF. 2004.NIMS author(s)SAGISAKA, KeisukeFUJITA, DaisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-22 22:44:46 +0900Updated at: 2017-07-10 18:56:01 +0900