HOME > Presentation > Detail(Nanoscale Electrical Meaurements with Quadruple-probe Atomic Force Microscope)中山 知信, 新ヶ谷 義隆, 繆 滌 霏, 青野 正和. Nano Spain 2014 Conference. March 11, 2014-March 14, 2014. InvitedNIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:37:19 +0900 Updated at: 2024-03-05 11:45:03 +0900