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光励起誘電緩和法(7):電荷伝搬分析を使ったnc-Si発光におけるEr添加効果の検討
(Photo-excited dielectric relaxation (7): Effects of Er doping on nc-Si analyzed with charge propagation measurement)

石井 真史, Iain Crowe, Matthew Halsall, Andrew Knights, Russell Gwilliam, Bruce Hamilton.
2012年春季 第59回 応用物理学関係連合講演会. 2012.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:23:31 +0900Updated at: 2017-07-10 21:18:20 +0900

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