HOME > Presentation > DetailScanning SQUID Microscopy as a tool for investigation of Superconducting Thin Films有沢 俊一, ユン キョンソン, 井口 家成, 羽多野 毅, Kazuhiro Endo, Tamio Endo. IUMRS-ICA2014. 2014. InvitedNIMS author(s)ARISAWA, ShunichiHATANO, TakeshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:32:40 +0900Updated at: 2024-03-05 11:45:03 +0900