HOME > Presentation > DetailSEM/STEM-TES(Transition Edge Sensor)を用いた材料分析(Material analysis using SEM/STEM-Transition Edge Sensor (TES))田中啓一, 大柿真毅, 茅根一夫, 原 徹, 松村晶. 公益社団法人日本顕微鏡学会 第72回学術講演会. June 14, 2016-June 16, 2016.NIMS author(s)HARA, ToruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:17:08 +0900Updated at: 2017-07-10 22:23:08 +0900