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SEM/STEM-TES(Transition Edge Sensor)を用いた材料分析
(Material analysis using SEM/STEM-Transition Edge Sensor (TES))

田中啓一, 大柿真毅, 茅根一夫, 原 徹, 松村晶.
公益社団法人日本顕微鏡学会 第72回学術講演会. June 14, 2016-June 16, 2016.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:17:08 +0900Updated at: 2017-07-10 22:23:08 +0900

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