HOME > Presentation > Detail(Electrical conductivity of nanowires measured by multiprobe scanning tunneling microscopy)中山 知信, 久保 理, 新ヶ谷 義隆, 青野 正和. International workshop on smart interconnects. November 06, 2003-November 08, 2003. InvitedNIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:06:26 +0900 Updated at: 2024-03-05 11:39:58 +0900