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走査型２探針原子間力顕微鏡による絶縁基板上での電気伝導測定
(Electrical transport measurement on insulating substrate using double-scanning-probe force microscope)
2009年秋季第70回応用物理学会学術講演会. September 08, 2009-September 11, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:15:50 +0900Updated at: 2017-07-10 20:36:08 +0900