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電荷移動ダイナミクスでみる希土類添加半導体の発光・消光過程 ‐電気測定で発光のメカニズムを探る－
(Photo-emission and quenching of rare-earth doped semiconductors evaluated by charge propagation dynamics: Optical emission mechanism investigated with electric measurement techniques)
酸化物EL素子研究会・平成24年度第一回研究会. 2012. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:43:11 +0900Updated at: 2024-03-05 11:43:57 +0900